Hello, thank you. This is very important information. I have captured some dislocation in SEM_STEM with a very good constant than TEM. Could you please provide some insights into why dislocations we can see easily in STEM mode.
This would be a nice addition to the Aztec software. But, unfortunately, not a single mineralogist participated in the development. Otherwise, the at% and atomic ratios of the elements would be used for identification, as mineralogists usually do. The approach used is unsuitable for identifying minerals of variable composition.
What is the meaning of following sentence in the process of EDS? Peak Overlap issue is addressed by fitting element peak shapes to the spectrum at every map pixel which results in the deconvolution of overlapped peaks in the spectra of every map pixel.
For the colors in the elemental mapping, do these colors always indicate the same specific element for each test? For example, is the C element always depicted in red?
Hello, there are a few ways in which you can do this, therefore please get in touch with our team, where we can assist you further > nano.oxinst.com/contact-us
Thank for your help. But I would like to modificate any kind of reports from Oxford, because I´m using yours but I´ll prefer to make my owns reports. Thank you again @@oxfordinstruments
We cover in this tutorial how to customise the template to be more personalised. Or do you want to find out something else? If you still have questions, please get in touch with us here, where we can help you > nano.oxinst.com/contact-us
Hello and thank you for getting in touch with us. Unfortunately, as it's a Proprietary document, we're unable to share it with you, however, if you have any questions please get in touch with us here > nano.oxinst.com/contact-us
The default in AZtecCrystal is to plot 1 point for every measured orientation, however, you can create a subset from the grain list that includes 1 representative point per grain, and plot these in the pole figures instead. Best wishes, Oxford Instruments.
Hi Milad, interaction volume and electron penetration depth can be calculated computationally. The simulations require a strong understanding of both the acquisition/experimentally parameters and the composition/structure of the material being analysed. As each electron interaction will be different, you can then use Monte Carlo simulations to simulate thousands of electron interaction, which can then be visualised to determine the interaction volume. A range of free scientific Monte Carlo software packages are available online, that have been optimised for EDS analysis. Oxford Instruments.
Hello and thank you for your question. Unfortunately, EBSD will not work on glass: being a diffraction technique, it requires the material to be crystalline to generate the necessary diffraction pattern. Therefore EBSD cannot be used to analyse glass unless there is a degree of crystallinity.
Hello Sarvesh, MapSweeper was introduced as part of the new AZtecCrystal release in June, this year. It is an available option in both the standard and advanced packages
For anyone struggling to listen to the audio in this video, we have re-recorded it with better audio here > ru-vid.com/video/%D0%B2%D0%B8%D0%B4%D0%B5%D0%BE-He5B_pMmm7s.html
Hello, I really appreciate your video, i found lots of information here. could you please elaborate about the x rays as in TEM the source is electrons rather then x rays. thanks
Hi, Thanks for your question, we skipped over a lot of the fundamental electron interactions and how they result in X-ray generation within materials. If you’re looking for a more fundamental explanation of X-ray generation from the electron interaction I would suggest watching our previous video ru-vid.com/video/%D0%B2%D0%B8%D0%B4%D0%B5%D0%BE-XxrGunKAL0o.html Thanks, Oxford Instruments
Is WDS a good technique to analyse the composition of porous materials (such as sol-gel-derived bioactive glasses)? And why? Are there any studies that discuss this matter?
It depends on what information is sought. For accurate quantitative data then the sample needs to be solid, flat, and polished. Therefore, for porous materials only qualitative WDS results are really possible. For example, WDS could be used to identify what elements are present in a porous sample, but not accurately determine the concentrations of these elements. I am afraid we don’t currently have any studies that have been conducted on porous materials. We hope this helps, Oxford Instruments.
The slit is essentially a collimator that sits in front of the detectors. The position of the slit can vary, and the optimal slit position is where is achieves the highest intensity for a given element-line. When a peak search is conducted in the AZtecWave software a slit position scan is performed, which determines the best slit position for the particular element-line. This would be a way of viewing the performance, and how the signal intensity varies with changing slit position. If further information is needed, please email contact us on nano@oxinst.com.
@@oxfordinstruments Thanks a lot! if the sweep is very wide, does the efficiency of the slit change as a function of wavelength? If so, by what percentage can it change once optimized for a given peak. For example in a spectrum of M lines the range is very wide.
Hi Lu, AZtecCrystal MapSweeper includes a full indexing method (Dynamic Template Matching - DTM) that has all the benefits of Dictionary Indexing (i.e. the ability to index reliably even very poor quality diffraction patterns) but without the drawbacks (for example, DTM needs no pre-calculation of a library of simulations, can work well for multiple phases, calculates the geometry calibration at every point in the dataset and involves immediate refinement of the solution to give better orientation precision than regular indexing methods). However, for most samples we do not need to use DTM, as MapSweeper’s “Refine” and “Repair” modes utilise pre-existing data (e.g. from Hough-based indexing) to enhance EBSD datasets much more effectively and quickly. Oxford Instruments
How much is the accuracy of EBSD technique plz? Is it possible to detect and study second phase particles of about 2 micron in size, disributed in a metalic matrix?
Hi Max, EBSD can be used to identify second phase particles. Regarding spatial resolution, the technique is limited by the performance of the SEM column and ultimately physics. 2 micron diameter particles should, however, be possible to resolve on most SEMs. We have several application notes showing examples of analysis of particles, such as nano.oxinst.com/campaigns/downloads/aztec-synergy-phase-identification-in-a-high-temperature-steel We hope this helps.
It would be nice if Oxford finally would update Aztec so we can finally change the colour of the labels on the micrographs...nice tip the multiple name changing.
Hello. Is there a way to select multiple spectra from Point ID and apply the same elements for each of them in one step (apart from the solution to do it before taking the sample). I would appreciate your answer. Thanks, Stefan
Hi Stefan, Thanks for your question. The easiest way to do this would be to use the Pre-defined elements tab that is located in the “Describe Specimen” step. Here you can select which elements you want included in your analysis. Once identified you can return to the spectrum and using the “Confirm Elements” step, use “clear all” to remove the Auto ID elements and then click “Pre-defined” to apply the pre-defined element selection.
@@oxfordinstruments thank you for the information and new upload. I will watch that. I am glad that customer feedback is heard at Oxford Instruments. :-)
