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李建模(James CM Li)
李建模(James CM Li)
李建模(James CM Li)
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This online course is offered by Prof. James CM Li, National Taiwan University.
18 6 Advanced Topics:  Power-aware ATPG
35:24
2 года назад
18 5 Advanced Topics: timing-aware ATPG
30:51
2 года назад
18 3 Advanced Topics: IDDQ testing
26:14
2 года назад
18 1 Advanced Topics:  Defects
23:32
2 года назад
10 4 Diagnosis EffectCause (*optional)
26:16
4 года назад
5 5 FaultSim DiffFsim(*optional)
23:15
4 года назад
16 3 MemTest March
25:18
4 года назад
16 2 Memory Test - Classical algorithms
23:41
4 года назад
16 1 MemTest Intro
32:25
4 года назад
11 2 DFT1 ScanConcepts
21:24
4 года назад
13 2 BIST1 LFSR
36:50
4 года назад
13 5 BIST1 CA
29:29
4 года назад
9 3 DelayTest PathTG
26:59
4 года назад
12 3 DFT2 Instruction (New version)
21:00
4 года назад
15 3 TestCompress HardwareStimulus
28:09
4 года назад
7 5 Combinational ATPG, PODEM
36:29
4 года назад
7 7 Combinational ATPG, SAT
8:48
4 года назад
3 4 FaultModeling DelayFault
28:04
4 года назад
Комментарии
@avinasha237
@avinasha237 11 часов назад
Is stuck at non-controlling value at gates is a 3rd rule.. In slide is written under rule number 2 of EFC rules
@clifford6862
@clifford6862 3 дня назад
Thank you for making such detailed series sir. I reviewed your lectures and got employed for a DFT position.
@prajwalr4878
@prajwalr4878 15 дней назад
Hello Professor, since yesterday all your videos got shuffeled in the playlist(It's not in order), can you please change that.
@fakeekaf2346
@fakeekaf2346 28 дней назад
Hi professor why test coverage will be reduced if we go for high compression ratio?
@yashdodia8048
@yashdodia8048 29 дней назад
Thank you sir ❤ from India
@orionspacecrafts
@orionspacecrafts 29 дней назад
saaor caan yuuu pleez speenk ingeezz
@bharadwaj767
@bharadwaj767 Месяц назад
FFT: scan flipflop is added to control "AND gate to 1" & "OR gate to 0" , Mux is required (with TestMode)
@LakishaDoheny
@LakishaDoheny Месяц назад
40181 Zita Fall
@bharadwaj767
@bharadwaj767 Месяц назад
It is an algorithm for single path/multiple path sensitization with new nomenclature -D- & -D'- (D cubes), Singular cubes etc., correct me.
@bharadwaj767
@bharadwaj767 Месяц назад
FFT: Q1. Problem with Multiple path sensitization is that we cannot find a specific path that causes faulty output; rather, we will have multiple paths. correct me, I am confused
@GhostRealm8
@GhostRealm8 Месяц назад
6:09 for 011,101 wired AND output is 1 not 0, please anyone point out if am wrong
@timsurf5138
@timsurf5138 2 месяца назад
TE 必讀
@masonwu2642
@masonwu2642 2 месяца назад
Nice overview
@masonwu2642
@masonwu2642 2 месяца назад
Appreciate~ It is a good overview.
@DakshinaMudunkotuwa
@DakshinaMudunkotuwa 2 месяца назад
Nice Video. The examples are really great. Thank you.
@avinasha237
@avinasha237 2 месяца назад
Kindly suggest some good text books
@avinasha237
@avinasha237 2 месяца назад
At 10:10 In the normal mode, there is only capture function and hence whatever the fault is stuck at, the flip flop is going to capture only that value. Hence it is difficult to detect stuck at fault in normal mode.
@周旗
@周旗 2 месяца назад
老师讲的真好
@MeenakshiVicky
@MeenakshiVicky 3 месяца назад
Very good explanation.. thank you soo much for sharing 🙂
@gaurav_kumar_504
@gaurav_kumar_504 3 месяца назад
35:40 😀😀
@venkatkiran1798
@venkatkiran1798 3 месяца назад
Thank you for every video
@RandomHubbb
@RandomHubbb 4 месяца назад
where is clock ir, clock dr, update clock coming?
@李建模-k8c
@李建模-k8c 3 месяца назад
TAP controller generates CLOCK IR, CLOCK DR, update DR and update IR. Instruction register generates CLOCK BR
@李建模-k8c
@李建模-k8c 3 месяца назад
Sorry, Instruction decoder generates CLOCK BR.
@RandomHubbb
@RandomHubbb 4 месяца назад
so confusing slide and explanation.
@HarishKumar-df3ps
@HarishKumar-df3ps 4 месяца назад
On launch on shift during str test we are not making any transition from 0 to 1 then how you are testing that pin
@kapildave7355
@kapildave7355 5 месяцев назад
Does anyone has the answer and explanation for the final last quiz FFT ?
@ArtremKost
@ArtremKost 5 месяцев назад
In 13:30 is it possible to test with 16 patterns in total (instead of 20 , we can parallel lines 17-20 to 13-16 , because those segment are independent)?
@shwetakumari2017
@shwetakumari2017 5 месяцев назад
why scan testing for logic is not applicable to memory?
@Rishabh-be6uk
@Rishabh-be6uk 6 месяцев назад
Still confused in +ve & -ve FF together...can u explain with more detailed example (assuming I will never get reply from 6 yr old video)
@jeminmehta7353
@jeminmehta7353 6 месяцев назад
How are no coupling faults detected in mats algorithm?
@MaThsMAC
@MaThsMAC 6 месяцев назад
Does this work for any M(x) when I try it it doesn't?
@mucaaco1
@mucaaco1 7 месяцев назад
This is by far the best DFT/ATPG lesson in RU-vid. I hope you keep these videos in RU-vid for all the future IC engineers to watch. Thank you very much.
@GreenTeaAndChill
@GreenTeaAndChill 7 месяцев назад
Your videos are extremely helpful for new test engineers like me. Thank you so much for sharing your knowledge in such a clear manner
@westbrookworm7501
@westbrookworm7501 7 месяцев назад
李老師牛逼
@shubhanand3791
@shubhanand3791 8 месяцев назад
@31:00 as we backtrack for G7 to be1 both input should be 0 but 3rd terminal is 1 ??
@RossYoungblood
@RossYoungblood 8 месяцев назад
Great material. I've been working in Automatic VLSI testing since 1980. Lots of good information here. :) Thanks for sharing!
@PiKa-c1z
@PiKa-c1z 8 месяцев назад
27:08 w value should be 3 because minimum weight is 3 why it's 2??
@srinudheer1
@srinudheer1 8 месяцев назад
In normal mode, the input signal is an absolute means designer give standard combination of inputs and expects the output but never assumes one of the input stuck to either 0 or 1. But this stuck part happens during manufacturing...so it can be detected in test mode only. I hope this is the correct answer
@alexanderkalla5857
@alexanderkalla5857 8 месяцев назад
korrekt, danke
@ganapathysenthilkumar
@ganapathysenthilkumar 10 месяцев назад
Q2 27:54 For XOR gate There is no equivalent faults , EFC is cannot be done (10),(11), 0:00 0:00 (01)/(00) these three test vectors are essential test vectors of XOR gate So, DFC also cannot be done 27:54
@ganapathysenthilkumar
@ganapathysenthilkumar 10 месяцев назад
Stuck @ 0 and 1 faults for primary outputs 17:56 So only we choose C/0 for last question of this session Is it right answer??
@nogukimo
@nogukimo 10 месяцев назад
Good Image of DFT, decrease Test Escape, Yield Loss%. Thanks Professor Li.
@yeonokkim3619
@yeonokkim3619 11 месяцев назад
Thank you professor for a great lecture. It makes clear what the scan test is than any other articles or videos. Does anyone know the answer for the question? Why can't stuck at zero fault be testable in normal mode?
@avinasha237
@avinasha237 2 месяца назад
Because in Normal mode there is only a capture function, hence it is not observable. In test mode there is both shift and capture function.
@Ali-kl3ql
@Ali-kl3ql 11 месяцев назад
Thank you professor, very good explanation.
@sanjeevkumar-gl5rd
@sanjeevkumar-gl5rd 11 месяцев назад
very nice lecture, love from India
@orcus_irl
@orcus_irl 11 месяцев назад
my staff literally copied your ppt 😂
@8754484388
@8754484388 11 месяцев назад
crisp and clear explanation, thank-you!
@zn4798
@zn4798 Год назад
what is the answer for the question
@ahyungrocks5509
@ahyungrocks5509 8 месяцев назад
On the last question, the FF2 will be stuck at 0 since after reset, output of FF2 will be cleared. This output then gets fed as an input to the only OR gate with a SA0 issue. As a result, FF2 output will never change; therefore, prevent the circuit from normal operation.
@zn4798
@zn4798 Год назад
what is the answer of the question?
@leoyou4790
@leoyou4790 Год назад
Thanks sir, it is a nice video. could you please explain why SE can be routed as normal signal under LOC? thanks
@shashikiran2995
@shashikiran2995 Год назад
Are there slides available for study purpose?