Enhancing the Sample Measurement Area in SEM EDS with Image Extension 

In this example of the elemental mapping of a seaworm sample Image Extension was employed to capture the entire sample. The 4 x 3 frames were automatically stitched together using Bruker's ESPRIT software.
With a simple click, Image Extension automatically stitches together multiple frames, extending the measurement area and providing a panoramic view of the sample. This innovative feature unlocks new possibilities for comprehensive analysis and visualization in various fields of research.
This particular sample was imaged using the XFlash® FlatQUAD detector, whose unique design facilitates high-resolution elemental mapping at the low energy required by delicate biological samples.
The integration of Image Extension with the XFlash® FlatQUAD detector represents a significant advancement in imaging technology, offering high speed mappings and count rates even at low beam currents.