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Evan
The functional tests are:
PC generates a decimal number, generates a IEEE574 HEX number for the decimal number and a conversion of the IEEE574 HEX number back to a decimal number.
Send the generated decimal number to the PC, with some sync codes as a string.
PIC receives the sync code and the PIC using an interrupt buffer ring builds the decimal number as a string. The PIC then converts the incoming decimal number string to a IEEE 574 single, then the PIC gens a HEX number from the single. the convert the single to a string. The PIC formats these newly calculated strings and send back to the PC.
The PC compare the incoming data to the expected values, logs the results with error conditions if appropriate.
There are millions of numbers to be tested.. doing this by hand would be a farce.
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16 сен 2024
