Dr Henss (Giessen University) focuses on the detailed interfacial analysis of materials used in energy conversion and storage. She is interested in studying the intricate surface and interfacial properties of materials using time-of-flight secondary ion mass spectrometry (ToF-SIMS), X-ray photoelectron spectroscopy (#XPS) and focused ion beam secondary electron microscopy (FIB-SEM), and performing extensive stability testing to gain a deeper understanding of the interfacial properties involved. She is also interested in transport experiments using SIMS to explore the fundamental mechanisms of ion conduction and transfer at interfaces. Her group is developing in-situ experiments that allow real-time observation of processes in materials and at interfaces. Complementing electrochemical measurements, this holistic approach is essential for a fundamental understanding of the underlying processes and mechanisms and is the basis for the development of high performance and reliable #battery #cells.
25 авг 2024
