Keithley S530 Testhead and Probe Card Interface 

The new Keithley S530 release includes an optional Testhead with support for S600, S400/S530, and 4070/4080 probe card interfaces. Safety interlock is now built into the locking mechanism for ease of use, and probe cards can be swapped out in seconds. System-level ISO-17025 calibration-to-the-pin is now possible that supports IATF-16949.
www.tek.com/ke...
The Keithley S530 is a semiconductor parametric test system that allows fully customizable, high-speed characterization of modern semiconductor technologies like GaN and SiC.
0:00 Introduction
0:30 Releasing the Testhead
1:23 Probe Card/Interface Access
2:03 Testhead Docking