The time pressure to develop and aggressively ramp new products at high yield is increasing across all semiconductor segments. In this presentation, Ian Lawee will outline these time to yield challenges. He also explains how Cohu's test cell first approach creates more flexible test cell solutions to be targeted at multiple device technologies which can shorten the cycle time to first-pass success for a portfolio of devices at high throughput and yield.
This paper was presented at Semicon Korea 2022
Learn more: www.cohu.com/
9 июн 2022
