Alpha Series- Wafer AOI (Automated Optical Inspection) - After sawing process 

Alpha is a series of high-performance Wafer AOI solutions that automatically detect major or minor wafer defects while providing reliable and precise results. It’s supported various types of wafer in semiconductor, electronics, automotive, and medical, Optoelectronic industry.
-Best fit for wafer inspection after sawing process.
-Wafer inspection size : 6inch, 8inch, 12 inch (Metal frame carrier)
-Main inspection defects : Unseparated Dies, Offset Cut/Missing Edge, Meandering, Chipping/ Crack and Slant Cut and Cosmetics.
For more information: www.cortexrobotics.my