AMT’s HBM Test Handler accommodates most existing test probe cards and is capable of handling 3D stacked HBM cubes and SiPs at the die level, that is, after-sawing. As AMT’s HBM Test Handler uses vision-guided alignment and adjustments, it has an alignment deviation range within ±5μm, allowing fine pitch probing without the need for jigs, trays, or pockets.
10 сен 2024