AMT5000_DIE(HBM) LEVEL TEST HANDLER 

AMT’s HBM Test Handler accommodates most existing test probe cards and is capable of handling 3D stacked HBM cubes and SiPs at the die level, that is, after-sawing. As AMT’s HBM Test Handler uses vision-guided alignment and adjustments, it has an alignment deviation range within ±5μm, allowing fine pitch probing without the need for jigs, trays, or pockets.