The 3rd Generation FH-1200 is a high throughput film frame test handler designed to handle QFN, WLCSP and eWLB packages. The FH-1200 enables high parallelism, post-saw testing of IC devices at ambient temperature. It can accommodate 200mm and 300mm wafer rings onto which multiple strips can be mounted.
The optional reject mark laser allows for a more efficient and cost-effective sorting and taping process.
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3 дек 2018
