How to calculate microstrain from XRD data using origin 

#microstrain #originlab #sayphysics
00:10 strain calculation from XRD data
02:30 estimation of microstrain using origin
05:20 determine the microstrain using origin
07:45 XRD characterization of microstrain in origin
08:50 estimation of lattice strain from xrd in origin
How to calculate microstrain from XRD data using origin
Origin and Excel Files:
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"X-ray diffraction analysis" "Microstrain calculation" "OriginLab software" "Data plotting" "Analyzing XRD data" "Materials characterization" "Crystallography" "Materials science" "Engineering" "Scientific data analysis" "Research methodology" "Experimental techniques" "Structural analysis" "Peak fitting" "Surface analysis" "Thin films" "Crystal defects" "Stress analysis" "Non-destructive testing" "X-ray spectroscopy"
All XRD Video Tutorials:
1. Baseline correction for XRD and FTIR data
• Baseline correction fo...
2. How to smooth XRD graph
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3. How to calculate the crystallite size from XRD data
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4. How to put negative hkl indices in XRD graph
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5. How to plot and match XRD data in WinXPow
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6. How to calculate crystallinity index from XRD data
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7. How to calculate d-spacing (interplanar spacing) from XRD data
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8. How to calculate lattice constants from XRD data
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9. How to calculate microstrain from XRD data
• How to calculate micro...
10. How to calculate dislocation density from XRD data
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11. How to subtract instrumental broadening (Kα1 and Kα2 overlap) from XRD data
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12. How to subtract instrumental broadening (βi) from XRD data
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13. Williamson-Hall Plot | W-H Plot | Crystallite Size | Microstrain | XRD data
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14. Williamson-Hall Plot | W-H Plot | Crystallite Size | Microstrain | XRD data
• Williamson-Hall Plot |...
15. Modified W-H Plots | UDM-USDM-UDEDM | Crystallite Size | Microstrain | Energy Density
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References:
prism.mit.edu/xray
Textbook References
•HP Klug and LE Alexander, X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd edition, John Wiley & Sons, 1974.
www.wiley.com/...
-Chapter 9: Crystallite Size and Lattice Strains from Line Broadening
•BE Warren, X-Ray Diffraction, Addison-Wesley, 1969
-reprinted in 1990 by Dover Publications
link.springer....
-Chapter 13: Diffraction by Imperfect Crystals
•DL Bish and JE Post (eds), Reviews in Mineralogy vol 20: Modern Powder Diffraction, Mineralogical Society of America, 1989.
-Chapter 6: Diffraction by Small and Disordered Crystals, by RC Reynolds, Jr.
-Chapter 8: Profile Fitting of Powder Diffraction Patterns, by SA Howard and KD Preston
•A. Guinier, X-Ray Diffraction in Crystals, Imperfect Crystals, and Amorphous Bodies, Dunod, 1956.
-reprinted in 1994 by Dover Publications
Article References
link.springer....
D. Balzar, N. Audebrand, M. Daymond, A. Fitch, A. Hewat, J.I. Langford, A. Le Bail, D. Louër, O. Masson, C.N. McCowan, N.C. Popa, P.W. Stephens, B. Toby, “Size-Strain Line-Broadening Analysis of the Ceria Round-Robin Sample”, Journal of Applied Crystallography 37 (2004) 911-924
•S Enzo, G Fagherazzi, A Benedetti, S Polizzi,
-“A Profile-Fitting Procedure for Analysis of Broadened X-ray Diffraction Peaks: I. Methodology,” J. Appl. Cryst. (1988) 21, 536-542.
-“A Profile-Fitting Procedure for Analysis of Broadened X-ray Diffraction Peaks. II. Application and Discussion of the Methodology” J. Appl. Cryst. (1988) 21, 543-549
•B Marinkovic, R de Avillez, A Saavedra, FCR Assunção, “A Comparison between the Warren-Averbach Method and Alternate Methods for X-Ray Diffraction Microstructure Analysis of Polycrystalline Specimens”, Materials Research 4 (2) 71-76, 2001.
•D Lou, N Audebrand, “Profile Fitting and Diffraction Line-Broadening Analysis,” Advances in X-ray Diffraction 41, 1997.
•A Leineweber, EJ Mittemeijer, “Anisotropic microstrain broadening due to compositional inhomogeneities and its parametrisation”, Z. Kristallogr. Suppl. 23 (2006) 117-122
•BR York, “New X-ray Diffraction Line Profile Function Based on Crystallite Size and Strain Distributions Determined from Mean Field Theory and Statistical Mechanics”, Advances in X-ray Diffraction 41, 1997.
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