This method is not for higher frequency characterization of components. It simply allows a person to determine the basic low frequency values of inductors and capacitors to identify or confirm their values.
0:15 - explanation of the test setup reference: www.electronics-notes.com/art...
2:30 - calibrating the nanoVNA
3:23 - looking at an inductor
6:24 - shunt configuration accuracy reference: www.signalintegrityjournal.co...
9:20 - looking at a capacitor
Reference regarding shunt method accuracy and why I chose to make measurements at 50 ohms or 90 degrees S11 phase: www.mwrf.com/technologies/tes...
Aug 2021 - For clarity, I would like to address the fact that measuring the reactive device under test at 50 ohms is not done because it “matches” the source impedance in the traditional sense that this concept would be understood by amateur radio operators with regards to maximum power transfer theory. This is not the intent at all. Rather, as has been stated in the video and supporting documentation, 50 ohms is used primarily because it lies within the shunt method’s best accuracy region. Secondary reasons include: it’s at 90 degrees on the smith chart (the top or bottom depending on what you’re measuring), is easy to remember, makes measurements consistent, keeps people away from going too low in frequency, avoids the self resonant frequency of the device and test fixture.
2 июн 2024
