We will present several case studies involving the application of x-ray diffraction analysis in the analysis of materials. Focus will be given to potential artifacts and common mistakes and misconceptions in the technique, ranging from the proper choice of the tool, proper configuration of optics, sample preparation and up to data processing and interpretation. Ten examples will be presented in increasing order of complexity, allowing us to gradually review the basic concepts of the technique and most common analytical methods. Various topics in XRD analysis will be covered: phase identification methods, quantitative analysis of mixtures, preferred orientation, in addition to rocking curve, high resolution scans and reciprocal lattice mapping of thin films as well.
16 авг 2020
