* Automatic formed test report, to be viewed on equipment or output to USB directly.
* PRF up to 10000Hz , fast scanning speed and without missing detection.
* To solve complex flaw detection (ultra-thin parts, ultra-small defects, near surface defects... etc.).
* With color A-Scan B-Scan C-Scan functions, built-in AWS standard
Any interests please contact us:
Wechat/Whatsapp/Skype:+86-13368265118
E-mail: della.zhang@leebtest.com
Website:www.leebtest.com
30 июн 2024