Engineer It - How to test power supplies - Measuring Noise 

that about probe it self. 1x10 ?? M ohm or coax 50 termineted

Is there any app can i use to measure the affected transistors in my mother board?

@Mario Kyree why am I smelling a whiff of scammy spam? Oh that's because InstaPwn is a scam! Time to report it.

I agree, the oscilloscope can measure level, but where in the frequency spectrum are those levels. That is my concern. Noise from a supply can be a problem for many circuits like simple audio circuits, but for for RF applications the noise that is often from a switching power supply oscillator can play havic on RF circuits. I did enjoy the video, just thought would give more info about RF noise.

+Hydranix HNx 500Mhz @2.5Gsps badass? We have a 100GHz @ 240Gsps in our lab. That's badass.

+Yo Da 10-100Zi?

Hydranix HNx Yeah! They have it in a half-height rack with other instruments which together costed more than several lambos! Pretty insane

and the probes cost more than a couple Toyotas right? As afraid as I would be to touch that thing, I want to play with it X)

That is true, although all RF grade cables and interconnect at those frequencies is severely priced! There are several engineers working on just making optimum use of the oscilloscope for HF measurements at the moment. At mm-wave frequencies instrumentation is a big PITA (or, "an art", if you prefer), and discerning between the noise floor and intermodulation distortion of the circuit under test and the internal circuitry inside the oscilloscope is really tough. I also learned just today that there is some considerable trickery going on for the highest frequency ranges. It's not a normal scope in several other ways than just the price haha.

I am wondering the same thing, but why not just use the springy ground probe to also measure the high frequency noise? That noise is still within the 100MHz range.

yes, I am wondering the same thing.

Hi Bodragon, Those very high frequency transient spikes are caused by a combination of EMI pick-up right at the probe, and IR voltage spikes during switching off (dead) times. The EMI pick-up is caused by the probe and/or return picking up a magnetic field caused by the fast switching edge rates, this contribution is mostly not real since it's the probe itself that's receiving the energy. On the other hand you will also see a spike during the dead times when both pass transistors within the regulator are off, caused by current flow continuing into a high Z. If your load is sensitive to these spikes (depending on your application), they can be minimized by reducing dead time, if possible. But in any case much can be removed with proper decoupling capacitance placed very close to the load. Series inductance can also be used to reduce the higher frequency noise but comes with ESR that will cause an IR drop across the inductor that must be considered. One of the many tradeoffs within a design. Thanks for the comment.

Thanks, LOL!

Give the guy a break, Im sure he's surrounded by more engineers you can poke a stick at.. let alone all his years of experience and training with a survivor and leader in the industry.. TI

What makes you better than him if you seemingly don't know the answer to your question yourself?

Hes an engineer.